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Scanning probe microscopy
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351	PHYSICAL REVIEW B 85, [removed]Scanning Hall probe microscopy of unconventional vortex patterns in the two-gap MgB2 superconductor J. Gutierrez,1,* B. Raes,1 A. V. Silhanek,1,2 L. J. Li,1 N. D. Zhigadlo,3 J. Karpin Add to Reading List Source URL: orbi.ulg.ac.be Language: English - Date: 2012-10-24 09:37:53 Vortices Phase transitions Quantum vortex Abrikosov vortex Type-1.5 superconductor Vortex Magnetic flux quantum Pinning force Physics Superconductivity Condensed matter physics
352	PAUL SCHERRER INSTITUT Technology Transfer R&D Services Add to Reading List Source URL: www.psi.ch Language: English - Date: 2014-11-28 07:19:08 Microscopy Microscope Electron microscope Scanning electron microscope Magnetic force microscope Optical microscope Scanning tunneling microscope Characterization Vibrational analysis with scanning probe microscopy Scientific method Scanning probe microscopy Science
353	Time Domain Reflectometry (TDR) is a nondestructive fault isolation technique used in the microelectronics industry for several years. This technique allows the localization of electrical failures, prior to destructive i Add to Reading List Source URL: www.c2mi.ca Language: English - Date: 2014-11-24 15:45:43 Electronics Technology Electrical impedance Soil physics Microelectronics Scanning probe microscopy Time-domain reflectometer Scanning voltage microscopy Electromagnetism Electronic engineering Time-domain reflectometry
354	Two-Dimensional Fine Particle Positioning Under Optical Microscope Using a Piezoresistive Cantilever as a Manipulator Metin Sitti and Hideki Hashimoto Institute of Industrial Science, University of Tokyo, Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Chemistry Atomic force microscopy Nanotechnology Cantilever Force spectroscopy Magnetic force microscope Scanning probe microscopy Science Scientific method
355	Advanced Robotics Journal, Vol. X, No. Y, 2002 (to appear) SCALED TELEOPERATION SYSTEM FOR NANO SCALE INTERACTION AND MANIPULATION Metin Sitti,1,∗ Baris Aruk,2 Hirohaki Shintani2 and Hideki Hashimoto2 1 Mechanical Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Technology Atomic force microscopy Scanning tunneling microscope Haptic technology AFM probe Contact mechanics Test probe Piezoelectricity Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method
356	Teleoperated and Automatic Nanomanipulation Systems using Atomic Force Microscope Probes Metin Sitti Dept. of Mechanical Engineering and The Robotics Institute, Carnegie Mellon University [removed] Abstract Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Nanotechnology Intermolecular forces Atomic force microscopy Nanoindentation Nanoparticle Vibrational analysis with scanning probe microscopy Thermal Probe Lithography Scanning probe microscopy Science Scientific method
357	IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 5, NO. 2, JUNE[removed]Controlled Pushing of Nanoparticles: Modeling and Experiments Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:36 Nanotechnology Intermolecular forces Atomic force microscopy Nanoparticle Electron Magnetic force microscope Local oxidation nanolithography Scanning probe microscopy Physics Science
358	IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 8, NO. 3, SEPT[removed]Atomic Force Microscope Probe based Controlled Pushing for Nano-Tribological Characterization Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Classical mechanics Force Introductory physics Nanotechnology Atomic force microscopy AFM probe Friction Sliding Scanning probe microscopy Physics Science Mechanical engineering
359	SPECTRUM At Tip of Scanning Probe CAS/MPG Partner Group on Thermoelectric Systems Shanghai-Mainz, [removed] – [removed] Add to Reading List Source URL: english.cas.cn Language: English - Date: 2014-12-19 10:40:40 Electricity Thermodynamics Emerging technologies Nanomaterials Graphene Graphite oxide Atomic force microscopy Thermoelectric materials Microscope Physics Chemistry Electromagnetism
360	1 Augmented Reality User Interface for an Atomic Force Microscope based Nanorobotic System Wolfgang Vogl, Bernice Kai-Lam Ma, and Metin Sitti, Member, IEEE Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Nanotechnology Atomic force microscopy AFM probe NanoWorld Haptic technology Microscopy Scanning tunneling microscope Local oxidation nanolithography Magnetic force microscope Scanning probe microscopy Science Scientific method

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